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A Microprocessor-Based System for Obtaining Variance-Length Curves of Jute YarnsJute Technological Research Laboratories, 12 Regent Park, Calcutta-700 040, India
Jute Technological Research Laboratories, 12 Regent Park, Calcutta-700 040, India
Jute Technological Research Laboratories, 12 Regent Park, Calcutta-700 040, India A microprocessor-based system for deriving variance-length curves in conjunction with Uster evenness tester has been described with particular reference to jute yams. Reliable variance-length curves can be obtained easily, and the higher CVs often encountered in jute yarns do not pose any problem. Thick and thin portions of the yarns can also be counted without additional circuitry.
Textile Research Journal, Vol. 55, No. 6,
372-376 (1985) |
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